Oxford Instruments Launches New XRF Analyzer

Oxford Instruments, Abingdon, United Kingdom, has launched the X MET7000 eXpress, described by the company as a new, faster handheld XRF (X-ray fluorescence) analyzer for high performance measurement. The new X-MET7000 eXpress delivers accurate analysis, lower limits of detection, improved precision (repeatability) and faster analysis time, the company says.

The X-MET7000 eXpress analyzes, verifies and screens materials up to four times faster than the X-MET7000 QuickSort with one pull of the trigger, the company says. This can be critical when dealing with large volumes of samples to analyze in limited time, as in the scrap and PMI markets, and in the environmental testing industry, saving costs and increasing productivity, the company adds.

The X-MET7000 eXpress includes Oxford Instruments’ 40 kV X-ray tube and high-resolution, high-count rate silicon-drift detector (SDD). It comes with what the company says is the largest alloy grades library available on the handheld XRF market, providing more than 1,600 grades to ensure accurate identification of metals.

As part of the X-MET7000 series, the X-MET7000 eXpress offers the largest touch screen available on the market with its intuitive and easy-to-read graphical user interface, says the company. Other features include large functional icons, a high contrast 4.3 inch Blanview transmissive LCD touch screen and up to 10-12 hours battery life on a single battery charge.

The handheld XRF analyzers come with unsurpassed reporting flexibility; reports can be downloaded on a USB memory stick, or to a laptop using a USB connection or WiFi. The results screen and reports can be customized. The rugged, yet light and compact design of the X-MET7000 series is designed to withstand the harshest environments and weather conditions, according to the company.

For more information or for a demonstration, email industrial@oxinst.com or visit http://www.oxford-instruments.com/.