Oxford Instruments Introduces X-MET5000 Analyzer

U.K.-based Oxford Instruments has announced the launch of the X-MET5000 X-ray fluorescence (XRF) analyzer.

The analyzer features Oxford Instruments’ patented PentaFET detector technology, “which guarantees fast analysis and lower detection limits for all elements of interest,” according to the company.

The X-MET5000 measures nickel, even in concentrations below 1 percent, Oxford reports in a press release. The instrument can be loaded with a metals analysis program and a plastics analysis program.  An analytical program for precious metals analysis is also available. 

The X-MET5000 features a Light Element Treatment (LET) mode, which facilitates analysis of matrix elements, even when the sample contains light elements like aluminum and silicon.

The analyzer is IP54 (NEMA 3) approved for dust and splash protection and features a battery life of a full working day on a single charge.  An optional bench-top stand enables hands-free operation.

More information is available at www.oxford-instruments.com