Bruker Introduces TracerTurboSD Analyzer

Bruker AXS, Kennewick, Wash., has introduced the TracerTurboSD, which it describes as “the world’s first handheld X-ray fluorescence (XRF) instrument that uses a silicon drift detector (SDD) for dramatically improved speed, sensitivity and resolution.”   

Bruker’s XFlash SDD, previously available only in high-performance laboratory XRF instruments, offers speed and analytical specificity, according to the company, when integrated into the handheld TracerTurboSD.

John Landefeld, vice president of Bruker AXS Handheld, says, “This breakthrough continues our tradition of technology leadership, going back to the initial introduction of tube-based XRF handhelds in 2001. Following the joint NASA-Bruker development of vacuum technology for handhelds in 2004, Bruker proves, once again, to be the technology leader in handheld XRF instrumentation.”

In the aerospace industry, the proprietary Bruker SDD technology enables TracerTurboSD users to analyze sophisticated light element alloys, even without the use of a vacuum or helium attachment, according to the company. In the general metals analysis markets, the TracerTurboSD offers higher speed, sensitivity and selectivity.

According to Bruker, the TracerTurboSD can measure aluminum in titanium alloys and magnesium and silicon in aluminum alloys, with no vacuum or helium required. For additional sensitivity, Bruker-NASA vacuum technology can be combined with the SDD. 

The analyzer includes all of the standard features of the Bruker S1 Tracer analyzer, such as grade ID and chemistry, a Pass/Fail analysis and a large grade library in the industry.

More information on the TracerTurboSD is available at www.bruker-axs.com/handheld.