Waltham, Massachusetts-based Olympus has introduced the Vanta Element-S hand-held X-ray fluorescence (XRF) analyzer, which it says delivers fast light element detection at an affordable price. The S model is equipped with a silicon drift detector (SDD) to analyze light elements such as magnesium (Mg), aluminum (Al), silicon (Si), sulfur (S) and phosphorus (P) in alloys.
Olympus says the model is ideal for scrap recycling, basic positive material identification, metal manufacturing and precious metals and effectively measures ferrous metals, aluminum, copper, stainless steel, nickel and gold karats. The analyzer offers clear on-screen grade ID and comparison for the light elements Mg, Al and Si in seconds. Its SDD detector can distinguish similar alloy grades like 303 stainless steel from 304 and aluminum 6061 or 6063 from 1100, Olympus adds.
For greater uptime and reliability, the analyzers are IP54 rated to resist dust and moisture and built to pass a 4-foot drop test to help protect from the occasional drop or jostle, the manufacturer notes. Other protective features include a stainless-steel faceplate and a Prolene window with Kapton mesh support that easily sticks on and peels off for toolless window changes in the field. The analyzers continuously perform in temperatures from 14 F to 113 F.
Olympus says the Vanta Element-S analyzers come with the features the Vanta series is known for: speed, reliability, ruggedness, connectivity and smartphone-like ease of use. Weighing 2.9 pounds, the analyzer is powered by Olympus’ Axon Technology for high-count rate and stability.
Optional wireless connectivity enables users to connect to the Olympus Scientific Cloud for wireless data sharing and access to fleet management tools, as well as to the Olympus mobile app or the user’s network. The analyzer also has a one-gigabyte microSD card to store results and two USB ports to export data. The Vanta Element-S is compatible with accessories like the Vanta field stand, soil foot, probe shield and holster.